Basic RF Testing of CCxxxx Devices

October 03, 2011 // By Abhishek Chattopadhyay, TI
Texas Instruments' low-power RF products make it easy to build wireless links for remote control, metering, and sensing applications. This paper provides a detailed overview of the different characterization tests (conducted, not radiated) performed during the device verification process of TI's low-power RF products. The document gives users a better understanding of the systems and functions, and presents general information about device testing under various conditions and parameters. The basic setup of the test system and procedural information about each test is also covered.
Texas Instruments, TI, RF, low power, wireless