Optimizing Low-Current Measurements and Instruments

March 16, 2011 // By Jonathan L. Tucker, Keithley
This paper provides an overview of the tools and techniques involved in obtaining accurate low-current measurements. Topics include hardware selection, potential sources of measurement error, and effective techniques for minimizing these errors. Example applications described include characterization of a field-effect transistor (FET) and a carbon nanotube.
Keithley Instruments, Optimizing Low-Current Measurements and Instruments