Tessent Cell-Aware Test

January 22, 2014 // By Stephen Pateras, Mentor Graphics
Tessent Cell-Aware ATPG is a transistor-level ATPG-based test methodology that achieves significant quality and efficiency improvements by directly targeting specific shorts; opens and transistor defects internal to each standard cell; resulting in significant reductions in defect (DPM) levels. Check out the paper to learn more.
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Mentor Graphics, Tessent Cell-Aware ATPG, transistor-level ATPG-based test methodology