Using DLP® Development Kits for 3D Optical Metrology Systems

June 02, 2011 // By Raul Barreto, TI
Structured light is the process of projecting known patterns of pixels onto an object. When combined with a synchronized camera, a structured light pattern generator can enable highly accurate 3D optical measurements. This application note presents the operating theory of structured light systems, as well as the key components and design considerations. Special attention is given to hardware selection (pattern generator and camera), and choice of structured light patterns. A sample implementation using the LightCommander™ development kit is detailed to provide the reader a starting point to developing their own system.
Texas Instruments, TI, DLP, 3D metrology