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Broadband vector network analyser

Anritsu Company has introduced the VectorStar Broadband ME7828A vector network analyser system that produces better dynamic range, measurement speed, and calibration and measurement stability over a frequency range of 70kHz to 110GHz. The performance and frequency coverage provide designers and manufacturers of microwave/millimeter wave components and devices with a single system to accurately and quickly measure devices from DC to daylight. Due to VectorStar’s 70kHz low-end frequency, it is possible to accurately measure devices starting at 70kHz for DC information and up to 110GHz for capturing all the performance of the device at multiple fundamental harmonics. The incorporation of VectorStar offers other performance advantages, including dynamic range improvements of up to 30dB compared to previous systems. The ME7828A also incorporates the fast switching speed of the company’s MG37022A sources to produce a sweep speed of 120ms for 201 points. Combining wide frequency range with 100,000 points in a single-channel, the ME7828A provides complete time domain analysis capability.

The ME7828A delivers improved calibration and measurement stability, typically 0.1dB over a 24-hour period. Two configurations are available. The standard ME7828A provides basic measurement capabilities for active device testing. The ME7828A-012 delivers additional optimal performance for active device testing, time domain analysis and device characterisation. Both configurations are compatible with existing SUSS and Cascade probe stations and appropriate positioners. The ME7828A system can be configured with a full range of banded millimeter-wave modules that extend the frequency range to 500GHz. A variable attenuator in the millimeter band modules for both configurations allows matching power of the two bands for a smooth transition when measuring active devices in the forward and reverse directions. Kelvin bias tees are designed into the multiplexing combiner modules in both configurations. The Kelvin bias tees provide sense and force capabilities, and are positioned close to the DUT (device under test) for optimum performance and sensitivity. The result is a significant reduction in IR losses compared to bias sourcing from inside the test set. In addition, the sensing circuit continuously monitors the bias conditions at the DUT and provides feedback corrections to the SMU (source monitor unit) bias supply equipment, as needed.