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Instrument and software package decodes DDR3

Fastest memory, on 1600 MTransfer/sec rate, analysed at full speed

For designers who anticipate using DDR3-generation memory in their designs, Tektronix has assembled a test toolset that spans the full range of performance of all three variants of DDR. DDR3 supports transfer rates up to 1600 MT/sec (mega-transfers per second) with clock rates in the range 400 to 800 MHz. The complete solution that Tek offers uses its TLA7000 logic analyser, with TLA7BB4 acquisition module, for at-speed logic analysis on the memory bus signals that can place any edge to within 20 psec; and the DAS8200 sampling ‘scope for TDR- and S-parameter-based analysis of the physical signal paths on circuit boards. It also calls for the DSA70000 digital serial analyser with a new DDR Analysis module for analogue signal validation and debug. With the new module, this part of the package can examine the DDR signalling and identify reads and writes: it can perform clock, jitter, amplitude timing and eye diagram measurements. To these Tektronix products, you must add third-party probing and software tools from Nexus Technology. Probing options include interposer cards that mount DIMM modules and intercept the signal paths; or solder-down probes that you can attach close to the BGA connections of the DRAM chips. You also have a compression-contact-probe option. Tek employs its TriMode probes that can operate in single-ended or differential modes with one connection, and you can use equivalent circuit models to predict the exact signal that the chip terminations will see. Single probe connection feed both logic analyser and ‘scope.DPOJET software carries out compete eye-diagram testing, in an upgraded DDR3 version. The Nexus software analyses the signal stream at protocol levels, and identifies violations there.