40 Gb/sec BER tester for datacom & long-haul testing

March 12, 2014 // By Graham Prophet
Tektronix’ PatternPro PPG is, Tek says, the first bit-error-rate test system with support for 40 Gb/sec data rates.

An integrated 40 Gb/sec programmable pattern generator (PPG), along with the previously announced 40 Gb/sec Programmable Error Detector now comprise a complete 40 Gb/sec BERT solution. With 200 fsec Random Jitter (RJ) and 8 psec risetime performance, the Tektronix PPG4001 delivers the performance and signal quality critical for serial data testing at 40 Gb/sec.

Design engineers developing high-speed data and long-haul communications technologies must test SERDES, ICs, components, modules, and systems. As data rates have continued to increase, engineers have until now struggled to find good test equipment options, particularly at 40 Gb/sec, Tek says. "The demand for bandwidth is strongly driving new standards and applications such as 100G Ethernet, 400G Ethernet, OIF-CEI VSR, and coherent optical communications," said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. "The PPG4001 and PED4001 are the fastest fully integrated, benchtop instruments in the industry, giving engineers the instrument performance they need to test their ICs, optical transceivers, and systems."

Features such as programmable data rates, PRBS and programmable data, and jitter insertion are necessary to determine if a design will meet applications requirements. The PPG4001 meets or exceeds the requirements for performance and features for 40 Gb/s serial data applications. In addition to high data rates and high-quality output signals, the PPG4001 increases engineer productivity with its built-in jitter stressing capabilities. The PPG4001 includes options for high-frequency jitter insertion (RJ, SJ, and BUJ) as well as low-frequency SJ. These built-in options are front panel push button or remotely programmable and allow for comprehensive stress testing of optical modules and electrical SERDES devices.

Ease of use features include a front panel touchscreen with a simple GUI and no instrument "reconfiguration" or characterisation in order to move from one test standard to the next. It also offers a wide range of programmable data rates and patterns, covering all of the operating conditions needed to comprehensively verify product performance and functionality.

Tektronix; www.tektronix.com