Anritsu expands pulse measurement capabilities in VNA series

August 26, 2013 // By Graham Prophet
A updated version of Anritsu's S4640B vector network analyser features facilities called PulseView and DifferentialView, to address challenges associated with testing and characterising radar and high-speed serial designs.

The expanded VectorStar family of Vector Network Analysers (VNAs) includes PulseView, which provides pulse profile, point-in-pulse and pulse-to-pulse measurements of S-parameters, and DifferentialView for true mode stimulus S-parameter measurements. PulseView enables design engineers and component manufacturers in the aerospace and defence industry to accurately test and characterise designs under pulse conditions. 2.5 nsec resolution with 100 dB dynamic range, coupled with independent measurement gates, provides unparalleled clarity of results. It also enables users to see performance perturbations on the rising/trailing edges and within a pulse that have been previously missed by other systems. Capture time of 500 msec permits you to measure under long pulse repetition interval conditions or to conduct pulse-to-pulse measurements over an extended number of pulses.

An additional, required, IF digitiser option provides fast digitisation for the PulseView application, as well as four internal pulse generators. The pulse generators can be used to modulate devices under test (DUT) or one of a series of associated Modulation Test Sets also available. These features are complemented by a graphical interface that simplifies measurement setup and raises confidence that the user is measuring under the correct conditions.

DifferentialView, together with an optional internal second source, provides engineers developing differential amplifiers or signal integrity engineers working on high-speed serial designs with the ability to evaluate their designs under true mode stimulus conditions. A GUI allows you to establish changes and see the results immediately without swapping of screen displays. When DifferentialView is used with Anritsu’s four-port test sets, users can make measurements of differential, common mode and mixed-mode S-parameters.

VectorStar units feature measurement capability down to frequencies as low as 70 kHz to achieve highly accurate S-parameter measurements necessary to accurately model devices in simulation applications, yielding low-frequency data that ensures good DC-term estimation and improves causality. VectorStar VNAs are available in frequency ranges from 70 kHz to 20, 40, 50 and 70 GHz, and as broadband systems from 70 kHz