BERT & eye-pattern test for 100-Gbit/sec multi-channel optical modules

February 23, 2017 // By Graham Prophet
Anritsu's BERTWave MP2110A series is optimized for manufacturing inspection of 100-Gbit/sec; it is an all-in-one instrument targeted at simultaneous BER (bit error rate) measurements and eye pattern analysis required for evaluation of optical modules and devices used in optical communications systems, including 100 GbE, InfiniBand EDR and 32G Fibre Channel.

Bit rates of optical modules used in data centres are migrating from 10G to 25G. The all-in-one MP2110A design cuts instrument capital costs, and its high-speed sampling shortens measurement times, while its high-sensitivity Error Detector performance improves yieldsec.

 

Unlike previous measurement environments requiring two separate instruments for measuring the BER and analyzing Eye Patterns, the MP2110A supports simultaneous measurements, saving equipment installation space. In addition, to shorten takt times on optical modules and devices production lines, the MP2110A maximum sampling speed has been increased to 250 ksamples/s, reducing Eye Pattern Analysis times for Eye Mask tests by 75% compared to earlier instruments. The MP2110A also supports options for expanding the built-in Bit Error Rate Tester (BERT) to 4ch at up to 28.2 Gbit/sec, and the built-in sampling oscilloscope to 2ch. As a result, the MP2110A can perform simultaneous TRx BER measurements of multi-channel optical modules, such as QSFP28, and simultaneous 2ch Eye pattern analyses, reducing measurement times by up to 65% compared to previous measurement systems.

 

With a minimum sensitivity of –15 dBm (typ. SMF), the sampling oscilloscope optical interface supports accurate Eye Pattern Analysis of signals that have been attenuated by switches, etc. The PPG Jitter performance of 600 fsec rms (typ.) and ED sensitivity of 25 mV (typ.) also support measurement with better performance than the device under test (DUT).

 

Anritsu; www.anritsu.com