Higher transmission rates, more transmission lanes and new multi-level data formats like PAM-4 address the increased transmission bandwidth demand for the next generation data center interconnects. The latest revisions of IEEE 802.3 bs and OIF CEI-56G implementation agreements define PAM-4 and NRZ interfaces for electrical chip-to-chip, chip-to-module, backplane connections and optical interfaces for up to 400 Gbit/sec bandwidth. R&D and validation labs who need to characterize receivers for data centre interconnects with PAM-4 or NRZ data rates up to 64 GBaud are facing new test challenges, such as tighter timing margins, channel loss, non-linearity, level interference and crosstalk effects—making test efficiency and accuracy essential.
The new M8040A is the latest member of the modular AXIe based M8000 series of BER test solutions. It is a highly integrated BERT that supports PAM-4 signals up to 64 GBaud and NRZ signals up to 64 Gbit/sec. The pattern generator module provides built-in de-emphasis, jitter injection and an optional second channel. Engineers and designers can select PAM-4 and NRZ in the user interface, eliminating the need for external combiners, cabling and deskew to provide PAM-4 signals. For best signal quality, remote heads reduce the distance to the device under test. The analyzer module provides true PAM-4 error analysis in real-time for long PRBS and QPRBS patterns. This allows proofing even low bit error ratios and symbol error ratios with the required confidence. Users can control the M8040A from a graphical and remote control interface.