The module has 48 single-ended and 6 differential channels with a voltage range between 0.9V and 3.6V. Dynamic test resources such as frequency counter, event detector, arbitrary waveform generator or digitizer are available for each channel. Thereby, both static and dynamic at-speed tests are possible, allowing a significant improvement in the structural fault coverage and more flexible test strategies.
The new model is based on the ASIC CION-LX, a JTAG controllable Mixed Signal Tester-on-Chip (ToC), developed by Goepel electronics. In context of the Boundary Scan software platform SYSTEM CASCON a comprehensive automation of the entire project development is possible with minimal effort.
The CION-LX module can be connected to any Test Access Port (TAP) and can be cascaded to increase the number of channels. The manufacturer sees it as an easy, safe and low cost solution to extend the Boundary Scan technology to non scanable partitions.
Visit Goepel electronics at www.goepel.com