Femto/picoammeters and electrometers for materials R&D

September 03, 2014 // By Graham Prophet
Keysight Technologies’ B2980A Series of femto/picoammeters and electrometers are the first graphical picoammeters and electrometers to confidently measure down to 0.01 fA which is 0.01 x 10-15 A, and up to 10 petaohms (PΩ) which is 10 x 1015 ohms

Materials R&D into, for example, nanomaterial, graphene, polymers and dielectrics, requires highly sensitive electronic measurement. However, making those measurements with a high degree of confidence is challenging. With its ability to make highly sensitive, low-current and high-resistance measurements, the B2980A Series addresses this challenge with a 2 pA to 20 mA operating range and an internal 1000V source, as well as innovative capabilities designed to optimise measurement confidence.

- A battery operation mode eliminates the effect of any AC power noise on measurements and enables detection of previously hidden signals.

- A time-domain view simplifies capture of transient signal effects as well as selecting the desired measurement data.

- A real-time histogram display capability allows quick statistical analysis of measurement data – a capability previously only available on an external PC. Because the display is continuously updated on a real-time basis, users can quickly debug their measurement environment and setup. This eliminates any ambiguity between the measurement environment and setup and the measurement data.


- A Test Setup Integrity function and dedicated accessories are designed to ensure maximum measurement accuracy. In sensitive measurement applications, setting up the appropriate cabling and equipment connections can be difficult. Conventional picoammeters and electrometers fail to address issues related to test setup, such as external cabling. With the B2980A Series' optional setup integrity checker function, users can now more easily isolate causes of noise.

Keysight (formerly Agilent) Technologies; www.keysight.com/find/b2980a