Growing need for smarter test systems in 2016, says NI

January 29, 2016 // By Graham Prophet
National Instruments (NI) has released its Automated Test Outlook for 2016 which, among other content, identifies key business and technology trends to help lower the cost of test.

The annual test and measurement report delivers NI’s view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.

“As strong advocates for excellence in automated test, we work closely with customers and suppliers to understand the top issues facing manufacturing and test departments,” said Luke Schreier, Director of Automated Test Marketing at NI.

Automated Test Outlook 2016 explores the following topics in a series of articles:

Computing: Harvesting Production Test Data

Semiconductor organisations pioneer real-time data analytics to reduce manufacturing test cost.

Software: Life-Cycle Management Is All About Software

Obsolescence, OS churn, and compatibility challenge long life cycle projects—an age-old problem warrants revisiting.

Architecture: The Rise of Test Management Software

Off-the-shelf test executives are effective solutions for the influx of new programming languages.

I/O: Standardising Platforms from Characterisation to Production

RFIC companies employ IP reuse and hardware standardisation across the product design cycle to reduce cost and shorten time to market.

Business Strategy: Making (mm)Waves in Test Strategy

Test managers are adopting modular solutions to economically validate high-frequency components.

You can download the complete report at