Hardware/software T&M approach to measuring flicker noise

March 14, 2014 // By Graham Prophet
Agilent Technologies’ EEsof EDA E4727A Advanced Low-Frequency Noise Analyser is a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Flicker noise, Agilent observes, has long been considered a critical characteristic of electronic devices. It significantly affects performance of circuits such as active mixers, voltage-controlled oscillators, frequency dividers, op amps and comparators; fundamental building blocks in RF, analogue/mixed signal, and high-speed wireline communication applications. Flicker noise and RTN are also both sensitive indicators of semiconductor material and manufacturing processes.

Agilent’s newest Advanced Low-Frequency Noise Analyser employs a modular design that allows it to minimise system noise, provide measurement capabilities at an ultra-low frequency, and offer the best high-voltage/high-current handling capabilities.

“Over the past two decades, Agilent has provided the world’s top semiconductor material suppliers, foundries, integrated device manufacturers, and design houses with systems for low-frequency noise characterisation,” says Brian Chen, device modelling planning manager at Agilent EEsof EDA. “The E4727A Analyser incorporates innovative measurement algorithms to deliver the industry’s fastest measurement speed to date.”

Agilent; www.agilent.com/find/eesof-a-lfna