High-speed BGA interposer allows probing DDR4 x16 designs with logic analyser

February 19, 2015 // By Graham Prophet
Resolving probing connectivity issues, this connection hardware offers unmatched performance, according to Keysight Technologies. The ball grid array (BGA) interposer solution is for testing DDR4 x16 DRAM designs with a logic analyser.

The interposer provides fast, accurate capture of address, command and data signals for debugging designs and making validation measurements. The W4631A BGA interposer, the fastest interposer solution available for use with a logic analyser, is used with Keysight’s E5849A probes for high-data-rate DDR4 DRAM designs.

The W4631A interposer solves probing connectivity by providing access to DDR4 x16 DRAM signals critical to debug and validation efforts. The probe works in many existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM with a DDR4 96 ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of high-speed DDR4 signals with low loading and minimal impact to signal integrity on embedded system design. The interposer solution is designed to be used with the U4154B logic analyser system. The Keysight W4631A BGA interposer is designed for data rates up to 3.2 Gb/sec.

Keysight Technologies; www.keysight.com/find/W4631A

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