This is accomplished with the InCarrier concept. The InStrip test handler is designed for high parallel tri-temp test of devices in substrate strips or lead frames over a complete temperature range. The modular and scalable concept of the InStrip supports different customer requirements to ensure a good return on investment. The same platform can be extended to test and calibrate MEMS devices in strip form by incorporating an optional MEMS test module. These sensor application-specific InMEMS test modules can be converted for various package types. The MEMS sensors are stimulated during test and contacted row-by-row with an integrated indexing mechanism supporting high parallel testing.
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