Multi-channel bit error rate tester hits 32 Gb/s for 100G networks

January 18, 2013 // By Nick Flaherty
Tektronix has launched a new series of high-speed pattern generators and error detectors to support 100G optical and serial data communications networks by testing signals as fast as 32 Gb/s.

The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels.

The market incentive to develop high-speed optical and data communications links is greater than ever as bandwidth-hungry smartphones, tablets and videos applications continue their rapid growth. Data communications researchers and designers in turn need high-speed test equipment for characterizing and testing optical and serial interfaces that typically employ multiple channels with data rates ranging from 10 to 32 Gb/s per channel.

For testing coherent optical modulation formats, such as DP-QPSK, the PPG3000 Series, with its 4 phase-aligned channels, can be used in conjunction with the Tektronix OM4000 Series Coherent Lightwave Signal Analyzer to enable optical designers to optimize and validate coherent modulation formats in real-time.

For bit error rate testing, the PED3000 Series can be combined with the PPG3000 to provide up to 32 Gb/s BER analysis with multi-channel support for quick identification of crosstalk issues common in multi-lane data communications architectures. For example, with IEEE802.3ba standards test, designers can simulate a 4 x 28G test bench to stress-test their receivers’ designs. The 32 Gb/s data rate output with adjustable jitter insertion enables design firms to bring product to market with industry best margin capabilities, improving yields and performance of their end products or chips.

“The addition of the PPG3000 and PED3000 Series’ to our BERT portfolio enables us to provide customers with choices for critical 100G standards testing,” said Brian Reich, general manager Performance Oscilloscopes, Tektronix. “For in-depth analysis requiring exacting signal integrity we continue to offer our award-winning BERTScope family. The new PPG3000 and PED3000 add the ability to conduct BERT tests that require multi-channel aligned data pattern generation up to 32 Gb/s.”

With six models, the PPG3000 Series includes models with 30 Gb/s or 32 Gb/s speeds and with one,