Multi-channel PXI-based test for LTE/LTE-Advanced waveform creation/analysis

June 27, 2014 // By Graham Prophet
Agilent Technologies’ LTE/LTE-Advanced multi-channel PXI-based test solution accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs: 15th July Webcast offers briefing.

Designing and characterising components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more complex as multi-antenna designs require increasingly complex multi-channel test configurations. Agilent's test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyse multiple channels in the frequency and modulation domains simultaneously. The graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimised for LTE/LTE-Advanced MIMO and carrier aggregation configurations.

The test solution’s chassis backplane trigger tool configures and routes the backplane triggers for proper time synchronisation in MIMO configuration for up to two PXIe chassis. Time-synchronised MIMO testing (2x2 or 4x4) is accomplished using Agilent’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analysers, which provide less than 0.38% EVM and less than 20 nsec time synchronisation between channels. In addition, the up-to-160 MHz signal generation and analysis bandwidth is capable of supporting the widest LTE-Advanced carrier aggregation applications.