Multi-function JTAG module focuses on analog testing

June 20, 2012 // By Paul Buckley
JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analog/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analog test access to PCBs via JTAG Technologies’ QuadPod signal conditioning interface.

The JT 2149/DAF module has been designed to slot into JTAG Technologies’ regular QuadPod transceiver system as used by the DataBlaster series of boundary-scan/JTAG controller hardware. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.

Capabilities of the JT 2149/DAF module include 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6 V plus frequency measurements of up to 128 MHz on any pin. 12 additional analog measurement channels can capture values from 0 to 33 V with better than 10 mV resolution. One further channel is available as a clock generator, programmable up to 64 MHz.

The JT 2149/DAF can be controlled through an interactive panel (virtual instrument) within JTAG ProVision as well as through Python scripts. A full Python API is included as part of JTAG Technologies current ProVision releases.

The modules are available immediately.

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