In his keynote address, Brendan Davis, leading industry expert and author of “The Economics of Automatic Testing”, will share his overview on the use of economic analysis to determine the optimum test strategy for electronics design, manufacturing and support. As the speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment, Davis will highlight how to effectively use automatic test equipment to minimise costs, maximise productivity and improve quality.
Delegates have a choice of five dedicated tracks that are tailored to meet the needs of a test professional. One presentation track entirely focussed on RF will explore topics such as envelope tracking, testing RADAR systems and overcoming WLAN test challenges up to 160 MHz bandwidth. Meanwhile, the Automated Test track gives delegates the opportunity to discover what’s new in NI TestStand 2013 and learn top development tips and tricks for this software. In addition, topics covered in ten hours of hands-on training include acquiring wireless measurements with PXI, maximising measurement speed with FPGA-based hardware, and prototyping a software-defined radio system. Registration is at; uk.ni.com/testsummit
National Instruments; www.ni.com
[Note; the venue is approximately 50 km west of London and accessible from London’s Heathrow airport.]