Built using a moisture-resistant tantalum nitride resistive film technology, the new E/H (Ta2N) QPL resistors offer enhanced specifications for military and aerospace applications, including tolerances to 0.1 % and a TCR of 25 ppm/°C.
The E/H (Ta2N) QPL resistors are intended for use in control systems for military and aerospace applications where moisture during operation or long-term storage may be a concern. The devices’ tantalum nitride resistive film assures a moisture resistance level that exceeds MIL-PRF-55342 limits by a factor of 50.
The E/H (Ta2N) Mil-PRF-55342 thin film resistors feature low noise of less than − 25 dB and a low voltage coefficient of 0.5 ppm/V. Their wraparound terminations feature a tenacious adhesion layer covered with an electroplated nickel barrier layer for + 150 °C operating conditions and contribute resistance of less than 0.010 Ω typical.
The new resistors are offered in M55342 case sizes from 01 to 12, with power ratings from 50 mW to 1000 mW, working voltages from 40 V to 200 V, and resistance ranges from 49.9 Ω to 3.3 MΩ depending on tolerance.
Production quantities of the E/H (Ta2N) Mil-PRF-55342 thin film resistors are available now, with lead times of 8 to 10 weeks.
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