NI & AWR presentation; Advances in the Design and Test of RF & Microwave Systems

September 06, 2013 // By Graham Prophet
A joint RF & Microwave symposium, for engineers in the UK, aims to show how to apply modular instrumentation to reduce the cost of test.

National Instruments UK & Ireland, and AWR (supplier and developer of high-frequency EDA software), invite engineers, researchers and technicians to discover the latest RF and Microwave technologies, techniques and applications at a free one-day event. The RF and Microwave Symposium will take place on 24th September 2013 in Hitchin, Hertfordshire, UK, and on 26th September at NI's UK & Ireland Headquarters in Newbury, Berkshire, UK. Throughout the day, delegates will learn how to optimise spectrum analyser measurements, implement phase-coherent MIMO systems and introduce real measurements alongside simulation in the design process.

Entitled “Applying Modular Instrumentation to Reduce the Cost of Test”, the keynote presentation will explore how NI’s modular, software-defined RF platform can help to lower the total ownership cost by reducing the number of legacy instruments needed, aiding in the insertion of new technology and reducing sustainment costs.

The symposium offers delegates a choice of two tracks tailored to specific interests; Wireless and Communications; or RF and Microwave. Delegates choosing the Wireless and Communication track will gain insight into how they can use automation to solve challenging problems in the RF and wireless industry. In addition, delegates will review key technology enhancements and test challenges associated with new standards such as IEEE 802.11ac and LTE Advanced.

The alternative track focuses on microwave, RADAR, RF and signal intelligence, with topics including the design and simulation of RADAR systems and PXI technologies for RF record and playback. Delegates will also learn valuable tips and tricks for capturing and demodulating off-the-air signals.

Register at;