NI’s highest-bandwidth PXIe chassis brings Intel Xeon processor to T&M

March 05, 2015 // By Graham Prophet
An eight-core processor in its embedded PXI controller, and PCI Express Gen 3 technology, offer up to a doubling of performance, increasing the ability to interpret raw data at speed in ATE and T&M applications. The image shows the chassis populated with a range of modular instruments.

National Instruments’ NI PXIe-8880 controller is based on the Intel Xeon processor, and the NI PXIe-1085 chassis is presented as the sector’s first chassis that uses PCI Express Gen 3 technology. The combination of the eight-core, server-class Intel Xeon processor E5-2618L v3 and full system bandwidth of 24 GB/sec delivers breakthrough performance for computationally intensive and highly parallel applications such as wireless test, semiconductor test and 5G prototyping. Engineers apply the flexibility of the PXI platform to replace previous generation controllers with the NI PXIe-8880 and see up to double the performance in their test and measurement applications.

The Xeon-based controller card, with associated memory

NI collaborated with Intel to deliver the server-class power of Intel Xeon processors to the test and measurement market. The embedded controller features eight cores, up to 24 GB of DDR4 memory and 24 lanes of PCI Express Gen 3 connectivity to the backplane. This provides engineers and scientists with up to twice the processing power and bandwidth compared to previous generation controllers. The 18-slot chassis incorporates PCI Express Gen 3 technology with eight lanes per slot for a matched total system bandwidth of 24 GB/sec, so any test and measurement system can scale well into the future.

 

Rear View of the NI PXIe-1085 24 GB/sec Chassis with the Power Shuttle Removed to View the PCI Express Gen 3 Switching Technology

When paired with LabVIEW system design software, NI adds, this next-generation PXI controller and chassis combination empowers engineers and scientists to turn 24 GB/sec of test and measurement data into readily usable insight. A white paper describing the system is at; www.ni.com/white-paper/52566/en/

National Instruments; www.ni.com