Novaled's new generation of materials includes NET-164 and NET-142 hosts, and NDN-77 and NDN-87 ETL dopants. Using various combinations of these dopants and hosts, Novaled can optimize OLED performance for lifetime or efficiency, depending on application requirements. Thus the new generation material addresses two previous OLED weaknesses:
- Low driving voltage caused lower lifetime due to higher charge carrier density in the emission zone.
- Air-sensitive N-side dopant materials required more complicated loading in mass production tools.
To achieve maximum efficiency in white PIN OLED devices, Novaled uses evaporation processable outcoupling layers – thin NET-61 layers in n-doped ETLs. The use of crystallizing outcoupling enhancement layers leads to corrugation of the reflective cathode, significantly reducing the plasmon absorption losses. Novaled has deepened its expertise on effective outcoupling and will introduce its latest data about a three-unit white stacked PIN OLED using NET-61
Novaled highlights this advance in OLED display and OLED lighting at the Society for Information Display's (SID) 49th annual International Symposium & Exhibition, “Display Week 2012,” June 3 - 8, 2012. Dr. Jan Birnstock, Vice President Technology & Products at Novaled, will present a paper on June 6 about Novaled's new class of OLED materials for OLED TV and OLED mobile display applications. Dr. Sven Murano, Product Senior Manager at Novaled, will present a paper on June 7 about Novaled's outcoupling materials for high-efficiency white OLEDs – light extraction crucial for both lighting and display applications.
For further information, visit www.novaled.com