Developers must often trigger measurements on signs of trouble, such as a time-out signal or error flag, when the root cause actually occurred long before the trigger point. The 16850 Series' high-speed timing capture with deep memory lets the designer look back in time to observe the location of the root cause of failure. The high sample resolution of these instruments makes it possible to differentiate timing problems from functional problems.
With 2.5 GHz, 400 psec period timing capture across all input channels, and up to 128-megasample memory depth, the analysers are up to 50% faster in timing capture with deep memory than any other portable logic analyser on the market, with twice the memory depth, Agilent asserts.
The 16850 Series offers a standard state data rate of 700 Mb per second as well as an upgrade option to 1400 Mb per second. Users can choose the desired memory depth, starting with the standard, 2-megasample depth, along with a variety of choices up to the maximum 128-megasample depth. Both state speed and memory depth options can also be upgraded after the initial purchase.
The 16850 Series also offers a 1.4-GHz trigger sequencer to track high-speed circuits and define very specific conditions to trigger on in an effort to trap errors and drive quickly to the root cause of failure. They offer measurement solutions for a wide range of bus and signal types. The FPGA Dynamic Probe application, built into the logic analyser interface, provides an automated approach for capturing internal Xilinx and Altera FPGA signals with deep memory state capture.
New low-cost probing has been designed for these analysers, including flying lead and Mictor options. Flying lead probes have single-ended data and differential clock inputs with a variety of accessories for connecting to targets. Existing 90-pin connector probes, used on Agilent modular logic analysers, are also compatible, opening up the portable logic analyser market to differential probing, DDR BGA probing,