The systems are optimized for characterizing the growing number of high power semiconductor devices, including those based on silicon carbide (SiC) and gallium nitride (GaN) technology, for research, reliability, failure analysis, and power device applications engineers; power device designers and incoming inspection technicians.
“Many power device developers have told us they like the dynamic range and ease of use of a traditional curve tracer, but they know they need more flexibility in configuring the measurement channels, as well as the accuracy, capability, and graphical user interface that a modern parametric analyzer offers,” said Lee Stauffer, Keithley staff technologist,
Rather than housed in a chassis, all seven configurations offer the flexibility to add new measurement channels as users’ needs evolve, with no need to return the system to the factory to install new hardware. A project could start with an entry level Parametric Curve Tracer , then add the capabilities of additional System SourceMeter instruments, such as higher voltage and/or higher current, at a later date. Six different System SourceMeter instrument models can be mixed and matched to create the optimum combination of voltage, current and power for the user’s specific needs. Keithley’s TSP Link virtual backplane technology allows any number of Source-Measure channels to be synchronized with other SourceMeter instruments in the system.
All seven configurations include the latest version of Keithley’s ACS (Automated Characterization Suite) Basic Edition software, which supports Keithley’s newest SMUs and takes maximum advantage of the Series 2600B’s TSP-Link connection trigger model, which allows for 500ns trigger synchronization between instruments. This tighter synchronization capability maximizes the high speed pulse mode capabilities of the new Model 2651A and Model 2657A High Power System SourceMeter instruments. The Windows-compatible ACS Basic Edition package provides control and analysis tools well-suited for high power device characterization, including complete parametric test libraries for MOSFETs, BJTs, triacs, diodes, IGBTs, and other device types. The software’s “trace” mode, which uses an on-screen slider control