PXI digitiser and LabVIEW jitter analysis toolkit increases flexibility

February 04, 2013 // By Jean-Pierre Joosting
National Instruments has announced the PXIe-5162 digitiser and updates to the LabVIEW Jitter Analysis Toolkit. The digitiser, with 10 bits of vertical resolution and a 5 GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope.

With 1.5 GHz of bandwidth and four channels in a single slot, the PXIe-5162 is suited for high-channel-count digitiser systems in manufacturing test, research and device characterisation. Engineers can use the digitiser with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimised for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments.

“The combination of high-speed, high-channel and high-resolution measurements offered by the PXIe-5162 digitiser makes it possible for traditional oscilloscope customers to think beyond traditional box instruments for automated test,” said Steve Warntjes, NI Director of Modular Instruments Research and Development. “Using our high-speed digitisers with the LabVIEW Jitter Analysis Toolkit helps engineers accelerate their measurement systems using the processing power of modern PCs instead of the legacy embedded processors on box oscilloscopes.”

The PXIe-5162 features 10 bits of vertical resolution for greater insight into the signal; four channels in a single 3U PXI Express slot, expanding to 68 channels in a single PXI chassis, and 5 GS/s maximum sample rate on one channel or 1.25 GS/s on four channels simultaneously.

The LabVIEW Jitter Analysis Toolkit features built-in functions for clock recovery, eye diagram, jitter, level and timing measurements. I also offers example programs for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.