PXI unit steps up source-measure capabilities

March 06, 2014 // By Graham Prophet
National Instruments’ PXIe-4139 source-measure unit (SMU) provides a claimed 100x faster sampling rate with at least twice the channel density of similar box instruments.

This SMU, says NI, can reduce overall cost of test and accelerate time to market for test engineers in a broad range of industries, from semiconductor to automotive and consumer electronics.

With the NI PXIe-4139, NI adds, engineers and scientists get broad IV boundaries, including extended range pulsing capability up to 500W and sensitivity down to 100 fA, to test a wide range of devices with a single instrument; ,the compact size of the NI PXIe-4139 can reduce system footprint significantly compared with box instrument SMUs.

The NI PXIe-4139 features NI SourceAdapt technology to help engineers produce optimal SMU response to any load by customising the SMU control loop. This protects devices under test and improves system stability. Additionally, the NI PXIe-4139 system SMU can take measurements at 1.8 Msamples/sec, which is 100x faster than traditional SMUs. This helps reduce test time and offers engineers the ability to capture transient device behaviour without an external scope.

100 fA current measurement sensitivity helps precisely characterise high-performance semiconductor devices. Up to 17 SMU channels in 4U 19-in. rack space minimises test system footprint for high-channel-count systems.

National Instruments; www.ni.com/smu