RFID test and measurement system

April 13, 2012 // By Julien Happich
The RFID Xplorer developed by CISC Semiconductor is a portable, compact, high-quality UHF RFID tag performance test system specifically designed as a cost-effective solution for testing RFID tag sensitivity, communication range and backscatter measurements.

Measuring 160x205x50mm, the CISC RFID Xplorer can be dismantled or set-up within minutes, saving time and guaranteeing user friendly handling. It can easily be applied for tag frequency sensitivity, communication range and backscatter measurements. The device operates within a frequency range from 800 MHz to 1 GHz and the

measurement speed achieved, using an appropriate computer running the Xplorer measurement software, is below 1 second per frequency. The device is available in two versions: an economical version for tests in open area and as a

high-precision solution for measurements in an RF controlled environment using a portable RF test chamber. The system is supplied with software and a reference tag for self-calibration.

Visit CISC Semiconductor at www.cisc.at