Tantalum capacitor reliability assessment and testing

July 16, 2013 // By Graham Prophet
Poised to replace the Weibull Reliability Assessment for hi-rel medical, military, and aerospace tantalum capacitors, AVX’s new Q-Process is detailed in a technical paper now available online

AVX has developed an innovative and effective process for the manufacture and test of high-reliability tantalum capacitors. Initially introduced to the military and aerospace industries at a Tantalum Hi-Rel Symposium held in Biddeford, Maine this January, Q-Process was also detailed in a technical paper presented at the Capacitor and Resistor Technical Symposium (CARTS) International conference in Houston, Texas on March 26. Q-Process potentially replaces the Weibull Reliability Assessment as the industry standard for tantalum capacitors. Driven by MIL standards and used to characterise the reliability of tantalum capacitors for decades, Weibull has become less relevant in recent years due to widespread improvements in manufacturing and testing technology.

Q-Process has received a provisional patent and is now available for small case size medical grade tantalum capacitors. The Q-Process is due to be available for military and aerospace product lines later this year.

For more information about the new Q-process and lot-acceptance methodology, the technical paper that AVX presented at the CARTS conference, “Reaching the Highest Reliability for Tantalum Capacitors,” is available at: http://avx.com/docs/techinfo/Qprocess.pdf

AVX, www.avx.com