Laboratories, research institutes and industrial facilities measuring surface topography with smartWLI interferometers can use MountainsMap to visualize surfaces, analyze surface geometry and texture, and generate detailed visual surface metrology reports.
The smartWLI product family uses white light interferometry to record 3D surface topography with depth resolution in the lower nanometer range. Because the measurement points are acquired and processed in parallel, height information can be gathered over a large area in a very short time. Typical applications in research and quality management include the characterization of surfaces with different roughness values (wafer structures, mirrors, glass, metals), the determination of step heights, and the precise measurement of curved surfaces (for example microlenses).
The four instruments in the versatile and economical smartWLI product family are designed to meet a wide range of requirements.
The compact and robust smartWLI-portable is placed directly on a surface and can measure large work pieces: it is used in quality management and process control as well as in research applications. The smartWLI-microscope is part of a retrofit kit for classical optical microscopes: it turns optical microscopes into 3D surface measuring devices. The smartWLI family is completed by two highly accurate and fast benchtop instruments: the compact smartWLI-basic and the smartWLI-extended (the extended model includes an electrical XY stage).
3D topography data measured by smartWLI interferometers is seamlessly exported to the MountainsMap imaging topography surface analysis software. Using MountainsMap it is possible to visualize 3D (x,y,z) surface topography at any angle or zoom level in real time. There is a full set of tools for analyzing micro and nano surface geometry.
Powerful pre-processing filters maximize image quality and advanced ISO 16610 metrological filters separate surface roughness and surface waviness. Roughness and other 3D areal surface texture parameters are calculated in accordance with the latest ISO 25178 standard. 2D profiles can be extracted from surfaces and a comprehensive set of 2D parameters can be calculated.
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