As part of its in-circuit debugging and visualisation tool, XJAnalyser, XJTAG has developed Waveform Viewer, which offers engineers a live, correlated view showing the digital signal levels and transitions of acquired JTAG Chain data. As well as displaying live data, Waveform Viewer also supports triggering, allowing circuit behaviour to be captured under specified conditions, such as when particular events occur. This can greatly improve an engineering team's ability to capture key information and track down intermittent faults.
Through the flexibility of JTAG it is possible to observe and capture run-time functionality, even under BGA devices where pins are not accessible to a standard logic analyser. Waveform Viewer also supports the same pin driving and toggling functionality offered in Chain View within XJAnalyser, allowing engineers to drive signals from JTAG and observe the rest of the board, ensuring it responds as expected.
XJTAG v3.4 also improves support for JTAG devices that feature multiple JTAG cores, such as advanced Microprocessors, specialist SoCs and ASICs. Using multiple JTAG chains allows more complex tests to be executed and by improving its multi-core support.
XJTAG’s production test environment, XJRunner has also been improved with greatly enhanced logging capabilities. The new enhanced format means log files can now contain the full details of errors, complete with links to the Layout and Schematic Viewers, which can be viewed long after the tests were carried out.
Other improvements in XJTAG v3.4 include enhancements within XJDeveloper that increase usability and speed project setup. These include improvements to the suggestions automatically made for Power and Ground nets, and to the formatting of project errors and warnings, which now include helpful links to direct the user’s attention to the right place in the project.
Visit XJTAG at www.xjtag.com