- BY BRIAN DIPERT • SENIOR TECHNICAL EDITOR
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- Edited By Fran Granville
- BY GRAHAM PROPHET, EDITOR
- By Richard A. Quinnell, Contributing Technical Editor, Test & Measurement World
Much of the drive to improve PXI’s RF performance came from the wireless communications industry.
Feedback, feedforward, and a disturbance observer get the job done.
- By Bonnie Baker
- Donald Boughton, Jr, International Rectifier, Orlando, FL
- JB Castro-Miguens, Cesinel, Madrid, Spain C Castro-Miguens, University of Vigo, Vigo, Spain
- Marián Štofka, Slovak University of Technology, Bratislava, Slovakia
- Jon Roman and Donald Schelle, National Semiconductor Corp, Santa Clara, CA
- By Paul Rako, Technical Editor
These ubiquitous parts keep getting better, and selecting them involves carefully weighing many specs and trade-offs.
- By Gina Bonini, Tektronix
Review test examples of system-level energymanagement design techniques for PCIe and low-power DDR memory.